Experiment on the Electron Phase Microscope
A method of electron phase microscopic observation is described which offers greater image contrasts for specimens possessing small phase differences than is possible with conventional methods of electron microscopic observation. It is shown that observation by dark contrast image using a phase plat...
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Veröffentlicht in: | Journal of applied physics 1958-07, Vol.29 (7), p.1046-1049 |
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container_issue | 7 |
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container_title | Journal of applied physics |
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creator | Kanaya, Kōichi Kawakatsu, Hisazo Itō, Kazuo Yotsumoto, Haruo |
description | A method of electron phase microscopic observation is described which offers greater image contrasts for specimens possessing small phase differences than is possible with conventional methods of electron microscopic observation.
It is shown that observation by dark contrast image using a phase plate, consisting of many holes in a carbon membrane, is very suitable for microtome section specimens as well as for thin crystal specimens, without a decrease in resolving power. |
doi_str_mv | 10.1063/1.1723360 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1723360</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1723360</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-3b67fb607feb244f46c002c25af191f3e55a9ce48ddb454fd9dffddcfed1eada3</originalsourceid><addsrcrecordid>eNotj01PwzAQRC0EEqFw4B_kilDKrj-S-IiqUJCK4ABny7F31aLSRHYO8O9JRU-jucybJ8QtwhKhVg-4xEYqVcOZKBBaWzXGwLkoACRWrW3spbjK-QsAsVW2EPfdz0hp902HqRwO5bSlsttTmNJc3rc-U_m6C2nIYRjpWlyw32e6OeVCfD51H6vnavO2flk9bqogrZoq1dcN9zU0TL3UmnUdZnqQxjNaZEXGeBtItzH22miONjLHGJgiko9eLcTd_-4RnBOxG-eHPv06BHe0dOhOluoPUGxEzA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Experiment on the Electron Phase Microscope</title><source>AIP Digital Archive</source><creator>Kanaya, Kōichi ; Kawakatsu, Hisazo ; Itō, Kazuo ; Yotsumoto, Haruo</creator><creatorcontrib>Kanaya, Kōichi ; Kawakatsu, Hisazo ; Itō, Kazuo ; Yotsumoto, Haruo</creatorcontrib><description>A method of electron phase microscopic observation is described which offers greater image contrasts for specimens possessing small phase differences than is possible with conventional methods of electron microscopic observation.
It is shown that observation by dark contrast image using a phase plate, consisting of many holes in a carbon membrane, is very suitable for microtome section specimens as well as for thin crystal specimens, without a decrease in resolving power.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.1723360</identifier><language>eng</language><ispartof>Journal of applied physics, 1958-07, Vol.29 (7), p.1046-1049</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-3b67fb607feb244f46c002c25af191f3e55a9ce48ddb454fd9dffddcfed1eada3</citedby><cites>FETCH-LOGICAL-c293t-3b67fb607feb244f46c002c25af191f3e55a9ce48ddb454fd9dffddcfed1eada3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kanaya, Kōichi</creatorcontrib><creatorcontrib>Kawakatsu, Hisazo</creatorcontrib><creatorcontrib>Itō, Kazuo</creatorcontrib><creatorcontrib>Yotsumoto, Haruo</creatorcontrib><title>Experiment on the Electron Phase Microscope</title><title>Journal of applied physics</title><description>A method of electron phase microscopic observation is described which offers greater image contrasts for specimens possessing small phase differences than is possible with conventional methods of electron microscopic observation.
It is shown that observation by dark contrast image using a phase plate, consisting of many holes in a carbon membrane, is very suitable for microtome section specimens as well as for thin crystal specimens, without a decrease in resolving power.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1958</creationdate><recordtype>article</recordtype><recordid>eNotj01PwzAQRC0EEqFw4B_kilDKrj-S-IiqUJCK4ABny7F31aLSRHYO8O9JRU-jucybJ8QtwhKhVg-4xEYqVcOZKBBaWzXGwLkoACRWrW3spbjK-QsAsVW2EPfdz0hp902HqRwO5bSlsttTmNJc3rc-U_m6C2nIYRjpWlyw32e6OeVCfD51H6vnavO2flk9bqogrZoq1dcN9zU0TL3UmnUdZnqQxjNaZEXGeBtItzH22miONjLHGJgiko9eLcTd_-4RnBOxG-eHPv06BHe0dOhOluoPUGxEzA</recordid><startdate>19580701</startdate><enddate>19580701</enddate><creator>Kanaya, Kōichi</creator><creator>Kawakatsu, Hisazo</creator><creator>Itō, Kazuo</creator><creator>Yotsumoto, Haruo</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19580701</creationdate><title>Experiment on the Electron Phase Microscope</title><author>Kanaya, Kōichi ; Kawakatsu, Hisazo ; Itō, Kazuo ; Yotsumoto, Haruo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-3b67fb607feb244f46c002c25af191f3e55a9ce48ddb454fd9dffddcfed1eada3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1958</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kanaya, Kōichi</creatorcontrib><creatorcontrib>Kawakatsu, Hisazo</creatorcontrib><creatorcontrib>Itō, Kazuo</creatorcontrib><creatorcontrib>Yotsumoto, Haruo</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kanaya, Kōichi</au><au>Kawakatsu, Hisazo</au><au>Itō, Kazuo</au><au>Yotsumoto, Haruo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Experiment on the Electron Phase Microscope</atitle><jtitle>Journal of applied physics</jtitle><date>1958-07-01</date><risdate>1958</risdate><volume>29</volume><issue>7</issue><spage>1046</spage><epage>1049</epage><pages>1046-1049</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>A method of electron phase microscopic observation is described which offers greater image contrasts for specimens possessing small phase differences than is possible with conventional methods of electron microscopic observation.
It is shown that observation by dark contrast image using a phase plate, consisting of many holes in a carbon membrane, is very suitable for microtome section specimens as well as for thin crystal specimens, without a decrease in resolving power.</abstract><doi>10.1063/1.1723360</doi><tpages>4</tpages></addata></record> |
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identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 1958-07, Vol.29 (7), p.1046-1049 |
issn | 0021-8979 1089-7550 |
language | eng |
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source | AIP Digital Archive |
title | Experiment on the Electron Phase Microscope |
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