Sensitivity of Pt/ZnO Schottky diode characteristics to hydrogen
Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current–voltage (I–V) characteristic shows a nonreversible...
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Veröffentlicht in: | Applied physics letters 2004-03, Vol.84 (10), p.1698-1700 |
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creator | Kim, Suku Kang, B. S. Ren, F. Ip, K. Heo, Y. W. Norton, D. P. Pearton, S. J. |
description | Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current–voltage (I–V) characteristic shows a nonreversible collapse to Ohmic behavior when as little as 50 ppm of H2 is present in the N2 ambient. At higher temperatures, the recovery is thermally activated with an activation energy of ∼0.25 eV. This suggests that introduction of hydrogen shallow donors into the ZnO is a contributor to the change in current of the diodes. |
doi_str_mv | 10.1063/1.1664012 |
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S. ; Ren, F. ; Ip, K. ; Heo, Y. W. ; Norton, D. P. ; Pearton, S. J.</creator><creatorcontrib>Kim, Suku ; Kang, B. S. ; Ren, F. ; Ip, K. ; Heo, Y. W. ; Norton, D. P. ; Pearton, S. J.</creatorcontrib><description>Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current–voltage (I–V) characteristic shows a nonreversible collapse to Ohmic behavior when as little as 50 ppm of H2 is present in the N2 ambient. At higher temperatures, the recovery is thermally activated with an activation energy of ∼0.25 eV. This suggests that introduction of hydrogen shallow donors into the ZnO is a contributor to the change in current of the diodes.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1664012</identifier><language>eng</language><ispartof>Applied physics letters, 2004-03, Vol.84 (10), p.1698-1700</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-2c4f3b7f9ebc15ba2df0e09d58f35986c08dbf8b0a79ced3291fc0b9d7f89e1c3</citedby><cites>FETCH-LOGICAL-c293t-2c4f3b7f9ebc15ba2df0e09d58f35986c08dbf8b0a79ced3291fc0b9d7f89e1c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Kim, Suku</creatorcontrib><creatorcontrib>Kang, B. 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J.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Suku</au><au>Kang, B. S.</au><au>Ren, F.</au><au>Ip, K.</au><au>Heo, Y. W.</au><au>Norton, D. P.</au><au>Pearton, S. J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sensitivity of Pt/ZnO Schottky diode characteristics to hydrogen</atitle><jtitle>Applied physics letters</jtitle><date>2004-03-08</date><risdate>2004</risdate><volume>84</volume><issue>10</issue><spage>1698</spage><epage>1700</epage><pages>1698-1700</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>Pt/ZnO Schottky diodes show changes in forward current of 0.3 mA at a forward bias of 0.5 V or alternatively a change of 50 mV bias at a fixed forward current of 8 mA when 5 ppm of H2 is introduced into a N2 ambient at 25 °C. The rectifying current–voltage (I–V) characteristic shows a nonreversible collapse to Ohmic behavior when as little as 50 ppm of H2 is present in the N2 ambient. At higher temperatures, the recovery is thermally activated with an activation energy of ∼0.25 eV. This suggests that introduction of hydrogen shallow donors into the ZnO is a contributor to the change in current of the diodes.</abstract><doi>10.1063/1.1664012</doi><tpages>3</tpages></addata></record> |
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title | Sensitivity of Pt/ZnO Schottky diode characteristics to hydrogen |
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