Use of fcc Metals as Internal Temperature Standards in X-Ray Diffraction
A clear pattern of systematic error is found in thermal expansion values for Al, Ag, and Au commonly recommended and used as internal references for temperature determination in x-ray diffraction. Evidence comes from a critical analysis of the literature, including several studies of temperature mea...
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| Veröffentlicht in: | Journal of applied physics 1970-04, Vol.41 (5), p.2235-2240 |
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| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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