Use of fcc Metals as Internal Temperature Standards in X-Ray Diffraction
A clear pattern of systematic error is found in thermal expansion values for Al, Ag, and Au commonly recommended and used as internal references for temperature determination in x-ray diffraction. Evidence comes from a critical analysis of the literature, including several studies of temperature mea...
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| Veröffentlicht in: | Journal of applied physics 1970-04, Vol.41 (5), p.2235-2240 |
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| container_end_page | 2240 |
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| container_issue | 5 |
| container_start_page | 2235 |
| container_title | Journal of applied physics |
| container_volume | 41 |
| creator | Simmons, R. O. |
| description | A clear pattern of systematic error is found in thermal expansion values for Al, Ag, and Au commonly recommended and used as internal references for temperature determination in x-ray diffraction. Evidence comes from a critical analysis of the literature, including several studies of temperature measurement errors in powder cameras, and from new calibration of a thermometer used previously in precise lattice and length expansion studies. Necessary changes in the commonly accepted values for expansion of Pt and MgO are implied. |
| doi_str_mv | 10.1063/1.1659193 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0021-8979 |
| ispartof | Journal of applied physics, 1970-04, Vol.41 (5), p.2235-2240 |
| issn | 0021-8979 1089-7550 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1659193 |
| source | AIP Digital Archive |
| title | Use of fcc Metals as Internal Temperature Standards in X-Ray Diffraction |
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