Properties of chalcogenide glass-silicon heterojunctions

The properties of heterojunctions between n- and p-type crystalline silicon and certain threshold-type amorphous chalcogenide films have been investigated. Low-field and high-field I-V characteristics, switching properties, and photoelectric behavior have all been studied. Devices fabricated with si...

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Veröffentlicht in:Applied physics letters 1973-01, Vol.23 (4), p.186-188
Hauptverfasser: Reinhard, D. K., Arntz, F. O., Adler, D.
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container_issue 4
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container_title Applied physics letters
container_volume 23
creator Reinhard, D. K.
Arntz, F. O.
Adler, D.
description The properties of heterojunctions between n- and p-type crystalline silicon and certain threshold-type amorphous chalcogenide films have been investigated. Low-field and high-field I-V characteristics, switching properties, and photoelectric behavior have all been studied. Devices fabricated with silicon substrates of opposite types are distinctly different; device characteristics at low voltages were found to be influenced appreciably by interface states. Short-circuit photocurrent data imply band models which explain the I-V properties in both the absence and the presence of light.
doi_str_mv 10.1063/1.1654853
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title Properties of chalcogenide glass-silicon heterojunctions
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