Study of GaN light-emitting diodes fabricated by laser lift-off technique

The fabrication process and performance characteristics of the laser lift-off (LLO) GaN light-emitting diodes (LEDs) were investigated. The LLO-GaN LEDs were fabricated by lifting off the GaN LED wafer structure grown on the original sapphire substrate by a KrF excimer laser at 248 nm wavelength wit...

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Veröffentlicht in:Journal of applied physics 2004-04, Vol.95 (8), p.3916-3922
Hauptverfasser: Chu, Chen-Fu, Lai, Fang-I, Chu, Jung-Tang, Yu, Chang-Chin, Lin, Chia-Feng, Kuo, Hao-Chung, Wang, S. C.
Format: Artikel
Sprache:eng
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Zusammenfassung:The fabrication process and performance characteristics of the laser lift-off (LLO) GaN light-emitting diodes (LEDs) were investigated. The LLO-GaN LEDs were fabricated by lifting off the GaN LED wafer structure grown on the original sapphire substrate by a KrF excimer laser at 248 nm wavelength with the laser fluence of 0.6 J/cm2 and transferring it onto a Cu substrate. The LLO-GaN LEDs on Cu show a nearly four-fold increase in the light output power over the regular LLO-LEDs on the sapphire substrate. High operation current up to 400 mA for the LLO-LEDs on Cu was also demonstrated. Based on the emission wavelength shift with the operating current data, the LLO-LEDs on Cu show an estimated improvement of heat dissipation capacities by nearly four times over the light-emitting devices on sapphire substrate. The LLO process should be applicable to other GaN-based LEDs in particular for those high light output power and high operation current devices.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1651338