$Direct measurement of the refractive index profile of phase gratings, recorded in silver halide holographic materials by phase-contrast microscopy$

Direct measurement of the refractive index profile of phase gratings, recorded in silver halide holographic materials by phase-contrast microscopy

Plane-wave phase holograms recorded in Agfa-Gevaert 8E75HD emulsions and processed by the combination of AAC developer and the R-9 bleaching agent were studied by phase-contrast microscopy, using high-power immersion (100×) objective. Thus the modulation of the refractive index as a function of the...

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Veröffentlicht in:	Applied physics letters 2003-11, Vol.83 (21), p.4282-4284
1. Verfasser:	Bányász, I.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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