Mixing characteristics of InGaAs metal–semiconductor–metal photodetectors with Schottky enhancement layers

We report on the optoelectronic (OE) mixing characteristics of a Schottky-enhanced InGaAs-based metal–semiconductor–metal photodetector (MSM–PD). The measured frequency bandwidth of such a mixer is less than that of a corresponding photodetector. The mixing efficiency depends on the light modulation...

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Veröffentlicht in:Applied physics letters 2003-06, Vol.82 (22), p.3814-3816
Hauptverfasser: Shen, H., Aliberti, K., Stann, B., Newman, P., Mehandru, R., Ren, F.
Format: Artikel
Sprache:eng
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Zusammenfassung:We report on the optoelectronic (OE) mixing characteristics of a Schottky-enhanced InGaAs-based metal–semiconductor–metal photodetector (MSM–PD). The measured frequency bandwidth of such a mixer is less than that of a corresponding photodetector. The mixing efficiency depends on the light modulation, local oscillator, and mixed signal frequencies and decreases nonlinearly with decrease in optical power. This is not observed in GaAs-based and non-Schottky-enhanced InGaAs MSM–PDs. We present a circuit model of the OE mixer to explain the experimental results.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.1579117