Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy
X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM mea...
Gespeichert in:
| Veröffentlicht in: | Applied physics letters 2003-04, Vol.82 (14), p.2299-2301 |
|---|---|
| Hauptverfasser: | , , , , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 2301 |
|---|---|
| container_issue | 14 |
| container_start_page | 2299 |
| container_title | Applied physics letters |
| container_volume | 82 |
| creator | Vogel, J. Kuch, W. Bonfim, M. Camarero, J. Pennec, Y. Offi, F. Fukumoto, K. Kirschner, J. Fontaine, A. Pizzini, S. |
| description | X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X–PEEM. |
| doi_str_mv | 10.1063/1.1564876 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1564876</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1564876</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-afeeaaa033986833405fe025f31dfd5d43e77cea37186305e10461bd43f5bc233</originalsourceid><addsrcrecordid>eNotUD1PwzAUtBBIlMLAP_DK4OKXFzvJiCqgSJVgKHPkOM_FKIkjO0Lk35OKTvcx3J2OsXuQG5AaH2EDSudloS_YCmRRCAQoL9lKSolCVwqu2U1K34tUGeKKfRx8TyJSCt0Ptbw3x4Emb3kbeuMH7hfDD0fezPxXRDPz8StMgXqfkg8Dp47sFBfSextDsmGcb9mVM12iuzOu2efL82G7E_v317ft017YrMJJGEdkjJGIValLxFwqRzJTDqF1rWpzpKKwZLCAUqNUBDLX0Cy-U41dpq_Zw3_uqThFcvUYl7VxrkHWpytqqM9X4B9UIFGd</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Vogel, J. ; Kuch, W. ; Bonfim, M. ; Camarero, J. ; Pennec, Y. ; Offi, F. ; Fukumoto, K. ; Kirschner, J. ; Fontaine, A. ; Pizzini, S.</creator><creatorcontrib>Vogel, J. ; Kuch, W. ; Bonfim, M. ; Camarero, J. ; Pennec, Y. ; Offi, F. ; Fukumoto, K. ; Kirschner, J. ; Fontaine, A. ; Pizzini, S.</creatorcontrib><description>X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X–PEEM.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1564876</identifier><language>eng</language><ispartof>Applied physics letters, 2003-04, Vol.82 (14), p.2299-2301</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-afeeaaa033986833405fe025f31dfd5d43e77cea37186305e10461bd43f5bc233</citedby><cites>FETCH-LOGICAL-c293t-afeeaaa033986833405fe025f31dfd5d43e77cea37186305e10461bd43f5bc233</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,782,786,27931,27932</link.rule.ids></links><search><creatorcontrib>Vogel, J.</creatorcontrib><creatorcontrib>Kuch, W.</creatorcontrib><creatorcontrib>Bonfim, M.</creatorcontrib><creatorcontrib>Camarero, J.</creatorcontrib><creatorcontrib>Pennec, Y.</creatorcontrib><creatorcontrib>Offi, F.</creatorcontrib><creatorcontrib>Fukumoto, K.</creatorcontrib><creatorcontrib>Kirschner, J.</creatorcontrib><creatorcontrib>Fontaine, A.</creatorcontrib><creatorcontrib>Pizzini, S.</creatorcontrib><title>Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy</title><title>Applied physics letters</title><description>X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X–PEEM.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNotUD1PwzAUtBBIlMLAP_DK4OKXFzvJiCqgSJVgKHPkOM_FKIkjO0Lk35OKTvcx3J2OsXuQG5AaH2EDSudloS_YCmRRCAQoL9lKSolCVwqu2U1K34tUGeKKfRx8TyJSCt0Ptbw3x4Emb3kbeuMH7hfDD0fezPxXRDPz8StMgXqfkg8Dp47sFBfSextDsmGcb9mVM12iuzOu2efL82G7E_v317ft017YrMJJGEdkjJGIValLxFwqRzJTDqF1rWpzpKKwZLCAUqNUBDLX0Cy-U41dpq_Zw3_uqThFcvUYl7VxrkHWpytqqM9X4B9UIFGd</recordid><startdate>20030407</startdate><enddate>20030407</enddate><creator>Vogel, J.</creator><creator>Kuch, W.</creator><creator>Bonfim, M.</creator><creator>Camarero, J.</creator><creator>Pennec, Y.</creator><creator>Offi, F.</creator><creator>Fukumoto, K.</creator><creator>Kirschner, J.</creator><creator>Fontaine, A.</creator><creator>Pizzini, S.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20030407</creationdate><title>Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy</title><author>Vogel, J. ; Kuch, W. ; Bonfim, M. ; Camarero, J. ; Pennec, Y. ; Offi, F. ; Fukumoto, K. ; Kirschner, J. ; Fontaine, A. ; Pizzini, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-afeeaaa033986833405fe025f31dfd5d43e77cea37186305e10461bd43f5bc233</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vogel, J.</creatorcontrib><creatorcontrib>Kuch, W.</creatorcontrib><creatorcontrib>Bonfim, M.</creatorcontrib><creatorcontrib>Camarero, J.</creatorcontrib><creatorcontrib>Pennec, Y.</creatorcontrib><creatorcontrib>Offi, F.</creatorcontrib><creatorcontrib>Fukumoto, K.</creatorcontrib><creatorcontrib>Kirschner, J.</creatorcontrib><creatorcontrib>Fontaine, A.</creatorcontrib><creatorcontrib>Pizzini, S.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vogel, J.</au><au>Kuch, W.</au><au>Bonfim, M.</au><au>Camarero, J.</au><au>Pennec, Y.</au><au>Offi, F.</au><au>Fukumoto, K.</au><au>Kirschner, J.</au><au>Fontaine, A.</au><au>Pizzini, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy</atitle><jtitle>Applied physics letters</jtitle><date>2003-04-07</date><risdate>2003</risdate><volume>82</volume><issue>14</issue><spage>2299</spage><epage>2301</epage><pages>2299-2301</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>X-ray photoemission electron microscopy (X–PEEM) is a powerful imaging technique that can be used to perform element selective magnetic domain imaging on heterogeneous samples with different magnetic layers, like spin valves and tunnel junctions. We have performed nanosecond time-resolved X–PEEM measurements, on the permalloy layer of a Ni80Fe20 (5 nm)/Cu (10 nm)/Co (5 nm) trilayer deposited on Si(111). We used the pump-probe mode, synchronizing a magnetic pulse from a microcoil with the x-ray photon bunches delivered by the BESSY synchrotron in single bunch mode. Images could be acquired during and after the 20 ns long and 80 Oe high field pulses. The nucleation and subsequent growth of reversed domains in the permalloy could be observed, demonstrating the feasibility of element selective and time-resolved domain imaging using X–PEEM.</abstract><doi>10.1063/1.1564876</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 2003-04, Vol.82 (14), p.2299-2301 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_1564876 |
| source | AIP Journals Complete; AIP Digital Archive |
| title | Time-resolved magnetic domain imaging by x-ray photoemission electron microscopy |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T03%3A50%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Time-resolved%20magnetic%20domain%20imaging%20by%20x-ray%20photoemission%20electron%20microscopy&rft.jtitle=Applied%20physics%20letters&rft.au=Vogel,%20J.&rft.date=2003-04-07&rft.volume=82&rft.issue=14&rft.spage=2299&rft.epage=2301&rft.pages=2299-2301&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.1564876&rft_dat=%3Ccrossref%3E10_1063_1_1564876%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |