Correlations between embedded single gold nanoparticles in SiO2 thin film and nanoscale crater formation induced by pulsed-laser radiation

A model SiO2 thin-film system containing gold nanoparticles serving as nanoscale absorbing defects is investigated with the goal of unraveling the connection between the 351 nm pulsed-laser energy absorption process inside a single defect and the resulting film damage morphology. For this purpose, g...

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Veröffentlicht in:	Journal of Applied Physics 2002-11, Vol.92 (10), p.5720-5728
Hauptverfasser:	Papernov, S., Schmid, A. W.
Format:	Artikel
Sprache:	eng
Schlagworte:	''CORRELATIONS BETWEEN EMBEDDED SINGLE GOLD NANOPARTICLES IN SIO2 THIN FILM AND NANOSCALE CRATER FORMATION INDUCED BY PULSED-LASER RADIATION''...(OAK/B202)........(REMARKS: NOT A FINAL REPORT) ABSORPTION DEFECTS ENERGY ABSORPTION EVAPORATION GOLD LASER RADIATION MATERIALS SCIENCE MELTING MORPHOLOGY PARTICLE SIZE SILICON OXIDES THIN FILMS
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