High resolution magnetic force microscopy using focused ion beam modified tips

High resolution magnetic force microscopy using focused ion beam modified tips

Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an ex...

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Veröffentlicht in:Applied physics letters 2002-07, Vol.81 (5), p.865-867
Hauptverfasser: Phillips, G. N., Siekman, M., Abelmann, L., Lodder, J. C.
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creator Phillips, G. N.
Siekman, M.
Abelmann, L.
Lodder, J. C.
description Atomic force microscope tips coated by the thermal evaporation of a magnetic 30 nm thick Co film have been modified by focused ion beam milling with Ga+ ions to produce tips suitable for magnetic force microscopy. Such tips possess a planar magnetic element with high magnetic shape anisotropy, an extremely high aspect ratio of greater than 30:1, and an end radius of less than 25 nm. These tips have been used in a commercial atomic force microscope under ambient conditions to obtain 30 nm resolution magnetic images of an established CoNi/Pt multilayer reference sample.
doi_str_mv 10.1063/1.1497434
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title High resolution magnetic force microscopy using focused ion beam modified tips
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