A device for surface study of confined micron thin films in a total internal reflection geometry
A device to probe the molecular structure of materials next to a solid interface in a thin film geometry has been developed. The device can produce controlled thicknesses as small as 1 μm with parallelity better than 0.003°. We have shown that the thickness and the parallelity of the film produced b...
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| Veröffentlicht in: | Review of scientific instruments 2002-06, Vol.73 (6), p.2321-2324 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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