Formation process of nanocrystalline materials from x-ray diffraction profile analysis: Application to platinum catalysts
It’s well known that x-ray line profile analysis is a powerful and convenient method to probe the microstructural characteristics of nanocrystalline samples. In the literature well-documented techniques are normally used to obtain crystalline size distributions from x-ray line-broadening analysis. H...
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| Veröffentlicht in: | Journal of applied physics 2002-04, Vol.91 (7), p.4556-4561 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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