Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates
The effect of uniaxial stress along the c axis on the metal–insulator transition of VO2 has been studied in the form of epitaxial thin films grown on TiO2 (001) and (110) substrates. A large reduction in the transition temperature TMI from 341 K for a single crystal to 300 K has been observed in the...
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Veröffentlicht in: | Applied physics letters 2002-01, Vol.80 (4), p.583-585 |
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description | The effect of uniaxial stress along the c axis on the metal–insulator transition of VO2 has been studied in the form of epitaxial thin films grown on TiO2 (001) and (110) substrates. A large reduction in the transition temperature TMI from 341 K for a single crystal to 300 K has been observed in the film on TiO2 (001) where the c-axis length is compressed owing to an epitaxial stress, while the TMI has been increased to 369 K in the film on TiO2 (110) where the c-axis length is expanded. The correlation between the c-axis length and TMI is suggested: the shorter c-axis length results in the lower TMI. |
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fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1446215</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1446215</sourcerecordid><originalsourceid>FETCH-LOGICAL-c225t-9458b943cad141c5697fe16f2f8172244eac36fc095363a2b20014a03b5a6e8e3</originalsourceid><addsrcrecordid>eNotUM1KAzEYDKJgrR58gxy7h63fl7_dPUrRKlR6qXpcsmmikW1WkhTx5jv4hj6JK_Y0zAwzA0PIJcIcQfErnKMQiqE8IhOEqio5Yn1MJgDAS9VIPCVnKb2NVDLOJ-T5wWbd_3x9-5D2vc5DpDnqkHz2Q6CDo09rRvOrD9T5fpfoSxw-Rj3QjR-NGQAWVIctnSFCQdO-S2M823ROTpzuk7044JQ83t5sFnflar28X1yvSsOYzGUjZN01ghu9RYFGqqZyFpVjrsaKMSGsNlw5A43kimvWsXFRaOCd1MrWlk9J8d9r4pBStK59j36n42eL0P490mJ7eIT_AiKUUNs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Muraoka, Y. ; Hiroi, Z.</creator><creatorcontrib>Muraoka, Y. ; Hiroi, Z.</creatorcontrib><description>The effect of uniaxial stress along the c axis on the metal–insulator transition of VO2 has been studied in the form of epitaxial thin films grown on TiO2 (001) and (110) substrates. A large reduction in the transition temperature TMI from 341 K for a single crystal to 300 K has been observed in the film on TiO2 (001) where the c-axis length is compressed owing to an epitaxial stress, while the TMI has been increased to 369 K in the film on TiO2 (110) where the c-axis length is expanded. The correlation between the c-axis length and TMI is suggested: the shorter c-axis length results in the lower TMI.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1446215</identifier><language>eng</language><ispartof>Applied physics letters, 2002-01, Vol.80 (4), p.583-585</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c225t-9458b943cad141c5697fe16f2f8172244eac36fc095363a2b20014a03b5a6e8e3</citedby><cites>FETCH-LOGICAL-c225t-9458b943cad141c5697fe16f2f8172244eac36fc095363a2b20014a03b5a6e8e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Muraoka, Y.</creatorcontrib><creatorcontrib>Hiroi, Z.</creatorcontrib><title>Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates</title><title>Applied physics letters</title><description>The effect of uniaxial stress along the c axis on the metal–insulator transition of VO2 has been studied in the form of epitaxial thin films grown on TiO2 (001) and (110) substrates. A large reduction in the transition temperature TMI from 341 K for a single crystal to 300 K has been observed in the film on TiO2 (001) where the c-axis length is compressed owing to an epitaxial stress, while the TMI has been increased to 369 K in the film on TiO2 (110) where the c-axis length is expanded. The correlation between the c-axis length and TMI is suggested: the shorter c-axis length results in the lower TMI.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNotUM1KAzEYDKJgrR58gxy7h63fl7_dPUrRKlR6qXpcsmmikW1WkhTx5jv4hj6JK_Y0zAwzA0PIJcIcQfErnKMQiqE8IhOEqio5Yn1MJgDAS9VIPCVnKb2NVDLOJ-T5wWbd_3x9-5D2vc5DpDnqkHz2Q6CDo09rRvOrD9T5fpfoSxw-Rj3QjR-NGQAWVIctnSFCQdO-S2M823ROTpzuk7044JQ83t5sFnflar28X1yvSsOYzGUjZN01ghu9RYFGqqZyFpVjrsaKMSGsNlw5A43kimvWsXFRaOCd1MrWlk9J8d9r4pBStK59j36n42eL0P490mJ7eIT_AiKUUNs</recordid><startdate>20020128</startdate><enddate>20020128</enddate><creator>Muraoka, Y.</creator><creator>Hiroi, Z.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20020128</creationdate><title>Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates</title><author>Muraoka, Y. ; Hiroi, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c225t-9458b943cad141c5697fe16f2f8172244eac36fc095363a2b20014a03b5a6e8e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Muraoka, Y.</creatorcontrib><creatorcontrib>Hiroi, Z.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Muraoka, Y.</au><au>Hiroi, Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates</atitle><jtitle>Applied physics letters</jtitle><date>2002-01-28</date><risdate>2002</risdate><volume>80</volume><issue>4</issue><spage>583</spage><epage>585</epage><pages>583-585</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The effect of uniaxial stress along the c axis on the metal–insulator transition of VO2 has been studied in the form of epitaxial thin films grown on TiO2 (001) and (110) substrates. A large reduction in the transition temperature TMI from 341 K for a single crystal to 300 K has been observed in the film on TiO2 (001) where the c-axis length is compressed owing to an epitaxial stress, while the TMI has been increased to 369 K in the film on TiO2 (110) where the c-axis length is expanded. The correlation between the c-axis length and TMI is suggested: the shorter c-axis length results in the lower TMI.</abstract><doi>10.1063/1.1446215</doi><tpages>3</tpages></addata></record> |
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title | Metal–insulator transition of VO2 thin films grown on TiO2 (001) and (110) substrates |
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