Test of negative ion beams from a microwave ion source with a charge exchange canal for accelerator mass spectrometry applications

A test facility has been constructed to evaluate negative ion beams from small gaseous samples for accelerator mass spectrometry applications. The positive ion beams from the microwave ion source are passed into a charge-exchange canal (CXC) where the ions exchange electrons with magnesium vapor and...

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Veröffentlicht in:	Review of Scientific Instruments 2002-02, Vol.73 (2), p.846-848
Hauptverfasser:	Kim, S-W., Schneider, R. J., von Reden, K. F., Hayes, J. M., Wills, J. S. C.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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