Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes
This article describes size dependent charge storage effect of the InAs nanodots in the barrier layers of Al0.5Ga0.5As/GaAs field-effect diodes. This charging effect is analyzed by a capacitance–voltage (C–V) measurement at 77 K, and results in a clockwise hysteresis loop due to the electron storage...
Gespeichert in:
Veröffentlicht in: | Journal of applied physics 2002-01, Vol.91 (2), p.819-822 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 822 |
---|---|
container_issue | 2 |
container_start_page | 819 |
container_title | Journal of applied physics |
container_volume | 91 |
creator | Koike, Kazuto Komai, Hisayoshi Li, Shuwei Yano, Mitsuaki |
description | This article describes size dependent charge storage effect of the InAs nanodots in the barrier layers of Al0.5Ga0.5As/GaAs field-effect diodes. This charging effect is analyzed by a capacitance–voltage (C–V) measurement at 77 K, and results in a clockwise hysteresis loop due to the electron storage at nanodot potentials. It is revealed that the number of stored electrons is nearly independent of dot size, and the amount of stored charge increases proportionally with dot density. The retention time of the stored charge, however, is deteriorated dramatically by the inclusion of coalesced dots in the storage nodes. These C–V characteristics are in good agreement with their photoluminescence properties. |
doi_str_mv | 10.1063/1.1420767 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1420767</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1420767</sourcerecordid><originalsourceid>FETCH-LOGICAL-c227t-ebcabf215b6a6463b29c5136472068970ba4fb9ce6f210ec43163bf0ba4398a63</originalsourceid><addsrcrecordid>eNotkEFPhDAQhRujibh68B_06gF2poVCj2Sj7CabeFDPpC1TF4Owabnor5eNXOYl876ZvDzGHhEyBCW3mGEuoFTlFUsQKp2WRQHXLAEQmFa61LfsLsYvAMRK6oTZt_6XeEdnGjsaZ-5OJnwSj_MUzKLkPbmZT57PJ-KHsY58NOPUTXPk_cjrAbKiMcuo47Yxi-t7Grp0Pev6qaN4z268GSI9rLphHy_P77t9enxtDrv6mDohyjkl64z1AgurjMqVtEK7AqXKSwFqSQ7W5N5qR2qBgFwucYH8ZS11ZZTcsKf_vy5MMQby7Tn03yb8tAjtpZwW27Uc-QcYclUk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Koike, Kazuto ; Komai, Hisayoshi ; Li, Shuwei ; Yano, Mitsuaki</creator><creatorcontrib>Koike, Kazuto ; Komai, Hisayoshi ; Li, Shuwei ; Yano, Mitsuaki</creatorcontrib><description>This article describes size dependent charge storage effect of the InAs nanodots in the barrier layers of Al0.5Ga0.5As/GaAs field-effect diodes. This charging effect is analyzed by a capacitance–voltage (C–V) measurement at 77 K, and results in a clockwise hysteresis loop due to the electron storage at nanodot potentials. It is revealed that the number of stored electrons is nearly independent of dot size, and the amount of stored charge increases proportionally with dot density. The retention time of the stored charge, however, is deteriorated dramatically by the inclusion of coalesced dots in the storage nodes. These C–V characteristics are in good agreement with their photoluminescence properties.</description><identifier>ISSN: 0021-8979</identifier><identifier>EISSN: 1089-7550</identifier><identifier>DOI: 10.1063/1.1420767</identifier><language>eng</language><ispartof>Journal of applied physics, 2002-01, Vol.91 (2), p.819-822</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c227t-ebcabf215b6a6463b29c5136472068970ba4fb9ce6f210ec43163bf0ba4398a63</citedby><cites>FETCH-LOGICAL-c227t-ebcabf215b6a6463b29c5136472068970ba4fb9ce6f210ec43163bf0ba4398a63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Koike, Kazuto</creatorcontrib><creatorcontrib>Komai, Hisayoshi</creatorcontrib><creatorcontrib>Li, Shuwei</creatorcontrib><creatorcontrib>Yano, Mitsuaki</creatorcontrib><title>Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes</title><title>Journal of applied physics</title><description>This article describes size dependent charge storage effect of the InAs nanodots in the barrier layers of Al0.5Ga0.5As/GaAs field-effect diodes. This charging effect is analyzed by a capacitance–voltage (C–V) measurement at 77 K, and results in a clockwise hysteresis loop due to the electron storage at nanodot potentials. It is revealed that the number of stored electrons is nearly independent of dot size, and the amount of stored charge increases proportionally with dot density. The retention time of the stored charge, however, is deteriorated dramatically by the inclusion of coalesced dots in the storage nodes. These C–V characteristics are in good agreement with their photoluminescence properties.</description><issn>0021-8979</issn><issn>1089-7550</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNotkEFPhDAQhRujibh68B_06gF2poVCj2Sj7CabeFDPpC1TF4Owabnor5eNXOYl876ZvDzGHhEyBCW3mGEuoFTlFUsQKp2WRQHXLAEQmFa61LfsLsYvAMRK6oTZt_6XeEdnGjsaZ-5OJnwSj_MUzKLkPbmZT57PJ-KHsY58NOPUTXPk_cjrAbKiMcuo47Yxi-t7Grp0Pev6qaN4z268GSI9rLphHy_P77t9enxtDrv6mDohyjkl64z1AgurjMqVtEK7AqXKSwFqSQ7W5N5qR2qBgFwucYH8ZS11ZZTcsKf_vy5MMQby7Tn03yb8tAjtpZwW27Uc-QcYclUk</recordid><startdate>20020115</startdate><enddate>20020115</enddate><creator>Koike, Kazuto</creator><creator>Komai, Hisayoshi</creator><creator>Li, Shuwei</creator><creator>Yano, Mitsuaki</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20020115</creationdate><title>Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes</title><author>Koike, Kazuto ; Komai, Hisayoshi ; Li, Shuwei ; Yano, Mitsuaki</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c227t-ebcabf215b6a6463b29c5136472068970ba4fb9ce6f210ec43163bf0ba4398a63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Koike, Kazuto</creatorcontrib><creatorcontrib>Komai, Hisayoshi</creatorcontrib><creatorcontrib>Li, Shuwei</creatorcontrib><creatorcontrib>Yano, Mitsuaki</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Koike, Kazuto</au><au>Komai, Hisayoshi</au><au>Li, Shuwei</au><au>Yano, Mitsuaki</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes</atitle><jtitle>Journal of applied physics</jtitle><date>2002-01-15</date><risdate>2002</risdate><volume>91</volume><issue>2</issue><spage>819</spage><epage>822</epage><pages>819-822</pages><issn>0021-8979</issn><eissn>1089-7550</eissn><abstract>This article describes size dependent charge storage effect of the InAs nanodots in the barrier layers of Al0.5Ga0.5As/GaAs field-effect diodes. This charging effect is analyzed by a capacitance–voltage (C–V) measurement at 77 K, and results in a clockwise hysteresis loop due to the electron storage at nanodot potentials. It is revealed that the number of stored electrons is nearly independent of dot size, and the amount of stored charge increases proportionally with dot density. The retention time of the stored charge, however, is deteriorated dramatically by the inclusion of coalesced dots in the storage nodes. These C–V characteristics are in good agreement with their photoluminescence properties.</abstract><doi>10.1063/1.1420767</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 2002-01, Vol.91 (2), p.819-822 |
issn | 0021-8979 1089-7550 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_1420767 |
source | AIP Journals Complete; AIP Digital Archive |
title | Size dependent charge storage effect of the InAs nanodots in Al0.5Ga0.5As/GaAs field-effect diodes |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T11%3A20%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Size%20dependent%20charge%20storage%20effect%20of%20the%20InAs%20nanodots%20in%20Al0.5Ga0.5As/GaAs%20field-effect%20diodes&rft.jtitle=Journal%20of%20applied%20physics&rft.au=Koike,%20Kazuto&rft.date=2002-01-15&rft.volume=91&rft.issue=2&rft.spage=819&rft.epage=822&rft.pages=819-822&rft.issn=0021-8979&rft.eissn=1089-7550&rft_id=info:doi/10.1063/1.1420767&rft_dat=%3Ccrossref%3E10_1063_1_1420767%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |