Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopies

Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopies

Images of a thin film permalloy element taken with Lorentz and magnetic force microscopies are compared with those from a simulation of the expected magnetic structure of the element. Measurements taken from the domain walls present in the element allow a quantitative comparison to be made. In the c...

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Veröffentlicht in:Journal of applied physics 2001-11, Vol.90 (10), p.5220-5227
Hauptverfasser: McVitie, Stephen, White, Gordon S., Scott, Jamie, Warin, Patrick, Chapman, John N.
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container_end_page 5227
container_issue 10
container_start_page 5220
container_title Journal of applied physics
container_volume 90
creator McVitie, Stephen
White, Gordon S.
Scott, Jamie
Warin, Patrick
Chapman, John N.
description Images of a thin film permalloy element taken with Lorentz and magnetic force microscopies are compared with those from a simulation of the expected magnetic structure of the element. Measurements taken from the domain walls present in the element allow a quantitative comparison to be made. In the case of magnetic force microscopy, quantification is made possible by using a nonperturbative approach based on an extended charge model for the magnetic probe. Excellent agreement between experiment and simulation is observed for both imaging techniques.
doi_str_mv 10.1063/1.1412829
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title Quantitative imaging of magnetic domain walls in thin films using Lorentz and magnetic force microscopies
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