Time-sharing utilization of a high-power pulsed-laser diode for inducing damage and for detecting its threshold level with high sensitivity
This article proposes a method to utilize a commercially available high-power pulsed-laser diode (HPLD) in time sharing to induce damage by laser irradiation and to detect the threshold level of the damage. This method features: (1) damage inducement when the HPLD is under the pulsed high-power lase...
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Veröffentlicht in: | Review of scientific instruments 2001-07, Vol.72 (7), p.3121-3124 |
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creator | Yarai, Atsushi Hirai, Atsushi Murahashi, Hirotaka Nakanishi, Takuji |
description | This article proposes a method to utilize a commercially available high-power pulsed-laser diode (HPLD) in time sharing to induce damage by laser irradiation and to detect the threshold level of the damage. This method features: (1) damage inducement when the HPLD is under the pulsed high-power laser oscillation mode, and (2) surface reflectivity measurement when the HPLD is under the cw light-emitted-diode illumination mode. This technique allows nondestructive measurement of the damage threshold level with high sensitivity, in spite of its extremely simple approach. Accordingly, the technique is appropriate for real-time inspection in a manufacturing process. The practical data for determining the damage threshold are shown. The damage threshold for aluminum (JIS A5052) was estimated to be approximately 62
mJ/mm
2
.
The capability of our proposed method is shown compared with that of more conventional methods. The advantages of our technique are described. |
doi_str_mv | 10.1063/1.1379965 |
format | Article |
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mJ/mm
2
.
The capability of our proposed method is shown compared with that of more conventional methods. The advantages of our technique are described.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1379965</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><ispartof>Review of scientific instruments, 2001-07, Vol.72 (7), p.3121-3124</ispartof><rights>American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c257t-1da57d9aa569e737e7670548b7380c416fbaf97f557b1cee4e058d080745186c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1379965$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,780,784,794,1559,4512,27924,27925,76384,76390</link.rule.ids></links><search><creatorcontrib>Yarai, Atsushi</creatorcontrib><creatorcontrib>Hirai, Atsushi</creatorcontrib><creatorcontrib>Murahashi, Hirotaka</creatorcontrib><creatorcontrib>Nakanishi, Takuji</creatorcontrib><title>Time-sharing utilization of a high-power pulsed-laser diode for inducing damage and for detecting its threshold level with high sensitivity</title><title>Review of scientific instruments</title><description>This article proposes a method to utilize a commercially available high-power pulsed-laser diode (HPLD) in time sharing to induce damage by laser irradiation and to detect the threshold level of the damage. This method features: (1) damage inducement when the HPLD is under the pulsed high-power laser oscillation mode, and (2) surface reflectivity measurement when the HPLD is under the cw light-emitted-diode illumination mode. This technique allows nondestructive measurement of the damage threshold level with high sensitivity, in spite of its extremely simple approach. Accordingly, the technique is appropriate for real-time inspection in a manufacturing process. The practical data for determining the damage threshold are shown. The damage threshold for aluminum (JIS A5052) was estimated to be approximately 62
mJ/mm
2
.
The capability of our proposed method is shown compared with that of more conventional methods. The advantages of our technique are described.</description><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqdkMtqwzAQRUVpoelj0T_QtgWlUmRJ9rKEviDQTbo2ijSKVRzLSEpC-gv96ToP6L6zGebOmTtwEbpjdMyo5I9szLiqKinO0IjRsiJKTvg5GlHKCyJVUV6iq5S-6FCCsRH6mfsVkNTo6LslXmff-m-dfehwcFjjxi8b0octRNyv2wSWtDoNg_XBAnYhYt_ZtdnfWr3SS8C6swfdQgaT9wufE85NhNSE1uIWNtDirc_NwRwn6JLPfuPz7gZdOD08uT31a_T58jyfvpHZx-v79GlGzESoTJjVQtlKayErUFyBkoqKolwoXlJTMOkW2lXKCaEWzAAUQEVpaUlVIVgpDb9G90dfE0NKEVzdR7_ScVczWu9TrFl9SnFgH45sMj4fgvkfvAnxD6x76_gvxcuDXg</recordid><startdate>200107</startdate><enddate>200107</enddate><creator>Yarai, Atsushi</creator><creator>Hirai, Atsushi</creator><creator>Murahashi, Hirotaka</creator><creator>Nakanishi, Takuji</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200107</creationdate><title>Time-sharing utilization of a high-power pulsed-laser diode for inducing damage and for detecting its threshold level with high sensitivity</title><author>Yarai, Atsushi ; Hirai, Atsushi ; Murahashi, Hirotaka ; Nakanishi, Takuji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c257t-1da57d9aa569e737e7670548b7380c416fbaf97f557b1cee4e058d080745186c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yarai, Atsushi</creatorcontrib><creatorcontrib>Hirai, Atsushi</creatorcontrib><creatorcontrib>Murahashi, Hirotaka</creatorcontrib><creatorcontrib>Nakanishi, Takuji</creatorcontrib><collection>CrossRef</collection><jtitle>Review of scientific instruments</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yarai, Atsushi</au><au>Hirai, Atsushi</au><au>Murahashi, Hirotaka</au><au>Nakanishi, Takuji</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-sharing utilization of a high-power pulsed-laser diode for inducing damage and for detecting its threshold level with high sensitivity</atitle><jtitle>Review of scientific instruments</jtitle><date>2001-07</date><risdate>2001</risdate><volume>72</volume><issue>7</issue><spage>3121</spage><epage>3124</epage><pages>3121-3124</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>This article proposes a method to utilize a commercially available high-power pulsed-laser diode (HPLD) in time sharing to induce damage by laser irradiation and to detect the threshold level of the damage. This method features: (1) damage inducement when the HPLD is under the pulsed high-power laser oscillation mode, and (2) surface reflectivity measurement when the HPLD is under the cw light-emitted-diode illumination mode. This technique allows nondestructive measurement of the damage threshold level with high sensitivity, in spite of its extremely simple approach. Accordingly, the technique is appropriate for real-time inspection in a manufacturing process. The practical data for determining the damage threshold are shown. The damage threshold for aluminum (JIS A5052) was estimated to be approximately 62
mJ/mm
2
.
The capability of our proposed method is shown compared with that of more conventional methods. The advantages of our technique are described.</abstract><doi>10.1063/1.1379965</doi><tpages>4</tpages></addata></record> |
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title | Time-sharing utilization of a high-power pulsed-laser diode for inducing damage and for detecting its threshold level with high sensitivity |
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