Determination of the dispersion of the index of refraction and the elastic moduli for molecular-beam-epitaxy-grown Zn1−xBexSe alloys

The prism coupler technique, together with reflectivity channeled spectra, were used to determine the dispersion of the indices of refraction for a series of ternary alloys of Zn1−xBexSe grown by molecular-beam epitaxy on GaAs substrates. The measurements covered the wavelength range of 400–1300 nm,...

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Veröffentlicht in:	Applied physics letters 2001-07, Vol.79 (4), p.473-475
Hauptverfasser:	Peiris, F. C., Bindley, U., Furdyna, J. K., Kim, Hyunjung, Ramdas, A. K., Grimsditch, M.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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