Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal

The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation betwe...

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Veröffentlicht in:Applied physics letters 2001-02, Vol.78 (6), p.796-798
Hauptverfasser: Mishina, E. D., Sherstyuk, N. E., Pevtsov, E. Ph, Vorotilov, K. A., Sigov, A. S., Moret, M. P., Rössinger, S. A., Larsen, P. K., Rasing, Th
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container_issue 6
container_start_page 796
container_title Applied physics letters
container_volume 78
creator Mishina, E. D.
Sherstyuk, N. E.
Pevtsov, E. Ph
Vorotilov, K. A.
Sigov, A. S.
Moret, M. P.
Rössinger, S. A.
Larsen, P. K.
Rasing, Th
description The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped.
doi_str_mv 10.1063/1.1329332
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_1329332</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_1329332</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1772-5415161cfc5e43628625a3e4050b9995d1c54a612385c980cd05c840ddd3ba8c3</originalsourceid><addsrcrecordid>eNpVkE1LxDAYhIMoWFcP_oMc3UPXvHmbNjnK4hcU1sN6EaSkSaqRblOSKuivt4t78TLDMDxzGEIuga2AlXgNK0CuEPkRyYBVVY4A8phkjDHMSyXglJyl9DFHwREz8loHo3s6xtD64Y2Gjk7vjo6h19H_6MmHgaZJT476YW5meWqvXuLWLzdIO9_vErWfcU_-Q6L7cjHp_pycdLpP7uLgC_J8d7tdP-T15v5xfVPnBqqK56IAASWYzghXYMllyYVGVzDBWqWUsGBEoUvgKIVRkhnLhJEFs9Ziq6XBBVn-7ZoYUoqua8bodzp-N8Ca_S8NNIdf8BfxhFRF</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal</title><source>AIP Journals Complete</source><source>AIP Digital Archive</source><creator>Mishina, E. D. ; Sherstyuk, N. E. ; Pevtsov, E. Ph ; Vorotilov, K. A. ; Sigov, A. S. ; Moret, M. P. ; Rössinger, S. A. ; Larsen, P. K. ; Rasing, Th</creator><creatorcontrib>Mishina, E. D. ; Sherstyuk, N. E. ; Pevtsov, E. Ph ; Vorotilov, K. A. ; Sigov, A. S. ; Moret, M. P. ; Rössinger, S. A. ; Larsen, P. K. ; Rasing, Th</creatorcontrib><description>The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.1329332</identifier><language>eng</language><ispartof>Applied physics letters, 2001-02, Vol.78 (6), p.796-798</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1772-5415161cfc5e43628625a3e4050b9995d1c54a612385c980cd05c840ddd3ba8c3</citedby><cites>FETCH-LOGICAL-c1772-5415161cfc5e43628625a3e4050b9995d1c54a612385c980cd05c840ddd3ba8c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Mishina, E. D.</creatorcontrib><creatorcontrib>Sherstyuk, N. E.</creatorcontrib><creatorcontrib>Pevtsov, E. Ph</creatorcontrib><creatorcontrib>Vorotilov, K. A.</creatorcontrib><creatorcontrib>Sigov, A. S.</creatorcontrib><creatorcontrib>Moret, M. P.</creatorcontrib><creatorcontrib>Rössinger, S. A.</creatorcontrib><creatorcontrib>Larsen, P. K.</creatorcontrib><creatorcontrib>Rasing, Th</creatorcontrib><title>Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal</title><title>Applied physics letters</title><description>The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNpVkE1LxDAYhIMoWFcP_oMc3UPXvHmbNjnK4hcU1sN6EaSkSaqRblOSKuivt4t78TLDMDxzGEIuga2AlXgNK0CuEPkRyYBVVY4A8phkjDHMSyXglJyl9DFHwREz8loHo3s6xtD64Y2Gjk7vjo6h19H_6MmHgaZJT476YW5meWqvXuLWLzdIO9_vErWfcU_-Q6L7cjHp_pycdLpP7uLgC_J8d7tdP-T15v5xfVPnBqqK56IAASWYzghXYMllyYVGVzDBWqWUsGBEoUvgKIVRkhnLhJEFs9Ziq6XBBVn-7ZoYUoqua8bodzp-N8Ca_S8NNIdf8BfxhFRF</recordid><startdate>20010205</startdate><enddate>20010205</enddate><creator>Mishina, E. D.</creator><creator>Sherstyuk, N. E.</creator><creator>Pevtsov, E. Ph</creator><creator>Vorotilov, K. A.</creator><creator>Sigov, A. S.</creator><creator>Moret, M. P.</creator><creator>Rössinger, S. A.</creator><creator>Larsen, P. K.</creator><creator>Rasing, Th</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20010205</creationdate><title>Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal</title><author>Mishina, E. D. ; Sherstyuk, N. E. ; Pevtsov, E. Ph ; Vorotilov, K. A. ; Sigov, A. S. ; Moret, M. P. ; Rössinger, S. A. ; Larsen, P. K. ; Rasing, Th</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1772-5415161cfc5e43628625a3e4050b9995d1c54a612385c980cd05c840ddd3ba8c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mishina, E. D.</creatorcontrib><creatorcontrib>Sherstyuk, N. E.</creatorcontrib><creatorcontrib>Pevtsov, E. Ph</creatorcontrib><creatorcontrib>Vorotilov, K. A.</creatorcontrib><creatorcontrib>Sigov, A. S.</creatorcontrib><creatorcontrib>Moret, M. P.</creatorcontrib><creatorcontrib>Rössinger, S. A.</creatorcontrib><creatorcontrib>Larsen, P. K.</creatorcontrib><creatorcontrib>Rasing, Th</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mishina, E. D.</au><au>Sherstyuk, N. E.</au><au>Pevtsov, E. Ph</au><au>Vorotilov, K. A.</au><au>Sigov, A. S.</au><au>Moret, M. P.</au><au>Rössinger, S. A.</au><au>Larsen, P. K.</au><au>Rasing, Th</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal</atitle><jtitle>Applied physics letters</jtitle><date>2001-02-05</date><risdate>2001</risdate><volume>78</volume><issue>6</issue><spage>796</spage><epage>798</epage><pages>796-798</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>The polarization state of a thin Pb(ZrTi)O3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped.</abstract><doi>10.1063/1.1329332</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record>
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title Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T05%3A06%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Local%20probing%20of%20the%20polarization%20state%20in%20thin%20Pb(ZrTi)O3%20films%20during%20polarization%20reversal&rft.jtitle=Applied%20physics%20letters&rft.au=Mishina,%20E.%20D.&rft.date=2001-02-05&rft.volume=78&rft.issue=6&rft.spage=796&rft.epage=798&rft.pages=796-798&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.1329332&rft_dat=%3Ccrossref%3E10_1063_1_1329332%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true