Time-resolved photoluminescence lifetime measurements of the Γ5 and Γ6 free excitons in ZnO

Time-resolved photoluminescence lifetime measurements of the Γ5 and Γ6 free excitons in ZnO

Time-resolved photoluminescence spectroscopy at 2 K was used to measure the radiative recombination lifetime of the allowed (Γ5) and forbidden (Γ6) free excitons in ZnO. The measurements were made on a sample containing internal strain, which altered the sample symmetry, and resulted in relaxed sele...

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Veröffentlicht in:Journal of applied physics 2000-08, Vol.88 (4), p.2152-2153
Hauptverfasser: Reynolds, D. C., Look, D. C., Jogai, B., Hoelscher, J. E., Sherriff, R. E., Harris, M. T., Callahan, M. J.
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container_end_page 2153
container_issue 4
container_start_page 2152
container_title Journal of applied physics
container_volume 88
creator Reynolds, D. C.
Look, D. C.
Jogai, B.
Hoelscher, J. E.
Sherriff, R. E.
Harris, M. T.
Callahan, M. J.
description Time-resolved photoluminescence spectroscopy at 2 K was used to measure the radiative recombination lifetime of the allowed (Γ5) and forbidden (Γ6) free excitons in ZnO. The measurements were made on a sample containing internal strain, which altered the sample symmetry, and resulted in relaxed selection rules, allowing the Γ6 exciton to be observed. A radiative recombination lifetime of 259 ps was measured for the Γ5 exciton and 245 ps for the Γ6 exciton. The decay of the free excitons was of single-exponential form, and the decay times were obtained using a least-squares fit of the data.
doi_str_mv 10.1063/1.1305546
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title Time-resolved photoluminescence lifetime measurements of the Γ5 and Γ6 free excitons in ZnO
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