Mapping electrostatic potential across an AlGaN/InGaN/AlGaN diode by electron holography
Electron holography has been used to image electrostatic potential variations across an AlGaN/InGaN/AlGaN heterojunction diode. Features in the energy profile have been interpreted in terms of the expected built-in voltage across the p-n junction of the diode as well as contributions from the sponta...
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Veröffentlicht in: | Applied physics letters 2000-05, Vol.76 (21), p.3055-3057 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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