Melting point depression of Al clusters generated during the early stages of film growth: Nanocalorimetry measurements

This work investigates the thermodynamic properties of small structures of Al using an ultrasensitive thin-film differential scanning calorimeter. Al thin films were deposited onto a Si3N4 surface via thermal evaporation over a range of thicknesses from 6 to 50 Å. The Al films were discontinuous and...

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Veröffentlicht in:	Applied Physics Letters 1998-03, Vol.72 (9), p.1098-1100
Hauptverfasser:	Lai, S. L., Carlsson, J. R. A., Allen, L. H.
Format:	Artikel
Sprache:	eng
Schlagworte:	ALUMINIUM CALORIMETRY GROWTH MATERIALS SCIENCE MELTING POINTS SOLID CLUSTERS TEXTURE THERMAL ANALYSIS THERMODYNAMIC PROPERTIES THIN FILMS
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