Variation of the relative permittivity of charged dielectrics

The variation of the relative permittivity of charged dielectrics with trapped charge density has been investigated by a time-resolved current method, in conjunction with a mirror image method employing a scanning electron microscope. The calculation is made by a mathematical expression derived from...

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Veröffentlicht in:	Applied physics letters 1998-01, Vol.72 (3), p.317-319
Hauptverfasser:	Ong, C. K., Song, Z. G., Oh, K. H., Gong, H., Le Gressus, C.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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