Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements
We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the...
Gespeichert in:
Veröffentlicht in: | Applied physics letters 1997-10, Vol.71 (16), p.2233-2235 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2235 |
---|---|
container_issue | 16 |
container_start_page | 2233 |
container_title | Applied physics letters |
container_volume | 71 |
creator | Tomm, J. W. Jaeger, A. Bärwolff, A. Elsaesser, T. Gerhardt, A. Donecker, J. |
description | We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging. |
doi_str_mv | 10.1063/1.120066 |
format | Article |
fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_120066</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1063_1_120066</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-d2fccc5b9c04a9107f10ce8ca1816520e28142a33b0cf4374969d8c93fbf46513</originalsourceid><addsrcrecordid>eNotkE9LwzAYxoMoOKfgR8jRS-f7Jm3WHMdwThh40XNJ02SLrE150yL101uZl-fP5YHnx9gjwgpByWdcoQBQ6ootENbrTCKW12wBADJTusBbdpfS11wLIeWChc0xdEfeU-wdDcElHj0_heOJ9_HbET-bNGsTYuO4ITJT4qYz5-nHNbye-C6OFBxlA5ku-Ugt709xiHYkct3AW2fSSK6dc7pnN96ck3v49yX73L18bPfZ4f31bbs5ZFZoHLJGeGttUWsLudHzBY9gXWkNlqgKAU6UmAsjZQ3W53Kda6Wb0mrpa5-rAuWSPV12LcWUyPmqp9AamiqE6g9RhdUFkfwFqWJaow</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements</title><source>AIP_美国物理联合会期刊回溯(NSTL购买)</source><creator>Tomm, J. W. ; Jaeger, A. ; Bärwolff, A. ; Elsaesser, T. ; Gerhardt, A. ; Donecker, J.</creator><creatorcontrib>Tomm, J. W. ; Jaeger, A. ; Bärwolff, A. ; Elsaesser, T. ; Gerhardt, A. ; Donecker, J.</creatorcontrib><description>We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.120066</identifier><language>eng</language><ispartof>Applied physics letters, 1997-10, Vol.71 (16), p.2233-2235</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-d2fccc5b9c04a9107f10ce8ca1816520e28142a33b0cf4374969d8c93fbf46513</citedby><cites>FETCH-LOGICAL-c291t-d2fccc5b9c04a9107f10ce8ca1816520e28142a33b0cf4374969d8c93fbf46513</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Tomm, J. W.</creatorcontrib><creatorcontrib>Jaeger, A.</creatorcontrib><creatorcontrib>Bärwolff, A.</creatorcontrib><creatorcontrib>Elsaesser, T.</creatorcontrib><creatorcontrib>Gerhardt, A.</creatorcontrib><creatorcontrib>Donecker, J.</creatorcontrib><title>Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements</title><title>Applied physics letters</title><description>We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging.</description><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNotkE9LwzAYxoMoOKfgR8jRS-f7Jm3WHMdwThh40XNJ02SLrE150yL101uZl-fP5YHnx9gjwgpByWdcoQBQ6ootENbrTCKW12wBADJTusBbdpfS11wLIeWChc0xdEfeU-wdDcElHj0_heOJ9_HbET-bNGsTYuO4ITJT4qYz5-nHNbye-C6OFBxlA5ku-Ugt709xiHYkct3AW2fSSK6dc7pnN96ck3v49yX73L18bPfZ4f31bbs5ZFZoHLJGeGttUWsLudHzBY9gXWkNlqgKAU6UmAsjZQ3W53Kda6Wb0mrpa5-rAuWSPV12LcWUyPmqp9AamiqE6g9RhdUFkfwFqWJaow</recordid><startdate>19971020</startdate><enddate>19971020</enddate><creator>Tomm, J. W.</creator><creator>Jaeger, A.</creator><creator>Bärwolff, A.</creator><creator>Elsaesser, T.</creator><creator>Gerhardt, A.</creator><creator>Donecker, J.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19971020</creationdate><title>Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements</title><author>Tomm, J. W. ; Jaeger, A. ; Bärwolff, A. ; Elsaesser, T. ; Gerhardt, A. ; Donecker, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-d2fccc5b9c04a9107f10ce8ca1816520e28142a33b0cf4374969d8c93fbf46513</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tomm, J. W.</creatorcontrib><creatorcontrib>Jaeger, A.</creatorcontrib><creatorcontrib>Bärwolff, A.</creatorcontrib><creatorcontrib>Elsaesser, T.</creatorcontrib><creatorcontrib>Gerhardt, A.</creatorcontrib><creatorcontrib>Donecker, J.</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tomm, J. W.</au><au>Jaeger, A.</au><au>Bärwolff, A.</au><au>Elsaesser, T.</au><au>Gerhardt, A.</au><au>Donecker, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements</atitle><jtitle>Applied physics letters</jtitle><date>1997-10-20</date><risdate>1997</risdate><volume>71</volume><issue>16</issue><spage>2233</spage><epage>2235</epage><pages>2233-2235</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><abstract>We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photocurrent (PC) measurements in two sets of aged LDA samples. The PC spectra reveal both the evolution of a defect band located in the optically active layer as well as modifications of the interband part of the spectrum upon aging. Such changes represent sensitive quantitative measures of the aging status and provide insight into the microscopic changes of the device structure upon aging.</abstract><doi>10.1063/1.120066</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-6951 |
ispartof | Applied physics letters, 1997-10, Vol.71 (16), p.2233-2235 |
issn | 0003-6951 1077-3118 |
language | eng |
recordid | cdi_crossref_primary_10_1063_1_120066 |
source | AIP_美国物理联合会期刊回溯(NSTL购买) |
title | Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T19%3A10%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Aging%20properties%20of%20high%20power%20laser%20diode%20arrays%20analyzed%20by%20Fourier-transform%20photocurrent%20measurements&rft.jtitle=Applied%20physics%20letters&rft.au=Tomm,%20J.%20W.&rft.date=1997-10-20&rft.volume=71&rft.issue=16&rft.spage=2233&rft.epage=2235&rft.pages=2233-2235&rft.issn=0003-6951&rft.eissn=1077-3118&rft_id=info:doi/10.1063/1.120066&rft_dat=%3Ccrossref%3E10_1063_1_120066%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |