Characterization of electron emission from planar amorphous carbon thin films using in situ scanning electron microscopy

Electron emission characteristics combined with in situ scanning electron microscope images have been measured on a series of amorphous carbon films grown by pulsed laser deposition. Uniform, reproducible current–voltage characteristics without morphological damage are only observed with sequential...

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Veröffentlicht in:Applied physics letters 1997-04, Vol.70 (15), p.1995-1997
Hauptverfasser: Missert, N., Friedmann, T. A., Sullivan, J. P., Copeland, R. G.
Format: Artikel
Sprache:eng
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