Flux penetration in bicrystal-substrate thin-film YBa2Cu3O7−δ Josephson junctions
We experimentally investigate the effect of flux penetration into the electrodes of a thin-film YBa2Cu3O7−δ grain boundary Josephson junction using the field-dependent critical current as a probe. Above a temperature-dependent threshold field for flux trapping we observe that the maximum critical cu...
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Veröffentlicht in: | Applied physics letters 1997-01, Vol.70 (4), p.517-519 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We experimentally investigate the effect of flux penetration into the electrodes of a thin-film YBa2Cu3O7−δ grain boundary Josephson junction using the field-dependent critical current as a probe. Above a temperature-dependent threshold field for flux trapping we observe that the maximum critical current Icmax is reduced, and occurs at an applied field Hpeak shifted from zero. The critical current also has an increasingly complex field-dependent structure. Despite this complexity, we experimentally find that Icmax follows a simple power law Hpeak−0.30. We present a model that predicts Icmax∝Hpeak−1/3 due to fluxons trapped in the electrodes. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.118197 |