Design considerations and performance characteristics of a dual mode time‐of‐flight mass spectrometer system for surface reactivity studies

We have designed a reflectron type time‐of‐flight mass spectrometer (TOFMS) system with both SIMS and electron impact (EI) ion optics. The system was designed to study the interaction of solid surfaces with reactive species initially in the gas phase. In the EI mode, the main TOFMS assembly, which c...

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Veröffentlicht in:	Review of scientific instruments 1989-10, Vol.60 (10), p.3160-3170
1. Verfasser:	Eldridge, Benjamin N.
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Mass spectrometers and related techniques Physics
Online-Zugang:	Volltext
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