Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids
A general circuit design is described for the transient hot‐strip method which is presently used for studies of electrical properties of thin metal films and for measurements of thermal properties of insulating solids and liquids. It is demonstrated that a low driving voltage can be used for thin fi...
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Veröffentlicht in: | Review of scientific instruments 1984-04, Vol.55 (4), p.610-613 |
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Sprache: | eng |
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