Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids

Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids

A general circuit design is described for the transient hot‐strip method which is presently used for studies of electrical properties of thin metal films and for measurements of thermal properties of insulating solids and liquids. It is demonstrated that a low driving voltage can be used for thin fi...

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Veröffentlicht in:Review of scientific instruments 1984-04, Vol.55 (4), p.610-613
Hauptverfasser: Gustafsson, Silas E., Karawacki, Ernest, Chohan, Mohammad Aslam
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Sprache:eng
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Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Transport properties of condensed matter (nonelectronic)
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container_end_page 613
container_issue 4
container_start_page 610
container_title Review of scientific instruments
container_volume 55
creator Gustafsson, Silas E.
Karawacki, Ernest
Chohan, Mohammad Aslam
description A general circuit design is described for the transient hot‐strip method which is presently used for studies of electrical properties of thin metal films and for measurements of thermal properties of insulating solids and liquids. It is demonstrated that a low driving voltage can be used for thin films having comparably high resistance, and that the output of power in the strip source (being the nonlinear component of the circuit) can be kept constant throughout the transient recording. The experimental arrangement for constant power conforms with the assumptions of the theory for the method and extends its validity to substantially larger temperature increases of the nonlinear resistance.
doi_str_mv 10.1063/1.1137766
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language eng
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subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Transport properties of condensed matter (nonelectronic)
title Circuit design for transient measurements of electrical properties of thin metal films and thermal properties of insulating solids or liquids
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