Low frequency noise properties of all-thin film superconducting point contacts
We report the results of low frequency voltage noise measurements of an all-thin film superconducting point contact (SPC). The SPC is prepared in liquid helium by application of a voltage pulse to a Nb-MgO-NbN edge sandwich. Increasing the amplitude of the pulse we may observe a gradual transition o...
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| Veröffentlicht in: | Applied physics letters 1994-04, Vol.64 (17), p.2309-2311 |
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| container_title | Applied physics letters |
| container_volume | 64 |
| creator | Hatle, M. Hamasaki, K. Kojima, K. |
| description | We report the results of low frequency voltage noise measurements of an all-thin film superconducting point contact (SPC). The SPC is prepared in liquid helium by application of a voltage pulse to a Nb-MgO-NbN edge sandwich. Increasing the amplitude of the pulse we may observe a gradual transition of a junction from the tunneling to metallic transport regime. We study the magnitude of low frequency noise during this transition and find that noise decreases quickly with decreasing ratio of subgap-to-supergap resistance. This result is contrasted with an opposite finding of C. T. Rogers and R. A. Buhrman [IEEE Trans. Magn. MAG-21, 126 (1985)] for the limit of a ‘‘leaky’’ tunnel junction. This comparison suggests that the excess subgap conductivity observed in our samples is caused by an Andreev reflection. |
| doi_str_mv | 10.1063/1.111654 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 1994-04, Vol.64 (17), p.2309-2311 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_111654 |
| source | AIP Digital Archive |
| title | Low frequency noise properties of all-thin film superconducting point contacts |
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