High pressure optical investigation of porous silicon
We have performed the first photoluminescence (PL) measurements under hydrostatic pressure up to 37 kbar at room temperature on several porous silicon (Si) samples fabricated under different etching conditions. A blue shift of the PL peak energy was observed in all samples from 0 to ∼20 kbar. Above...
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Veröffentlicht in: | Applied physics letters 1992-09, Vol.61 (12), p.1435-1437 |
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container_title | Applied physics letters |
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creator | ZHOU, W SHEN, H HARVEY, J. F LUX, R. A DUTTA, M LU, F PERRY, C. H TSU, R KALKHORAN, N. M NAMAVAR, F |
description | We have performed the first photoluminescence (PL) measurements under hydrostatic pressure up to 37 kbar at room temperature on several porous silicon (Si) samples fabricated under different etching conditions. A blue shift of the PL peak energy was observed in all samples from 0 to ∼20 kbar. Above ∼20 kbar, the PL peak energy appears to be constant or even to exhibit a small red shift with pressure in some samples. This pressure dependence of the PL peak energy of porous Si is different from the pressure induced red shift in the PL from the indirect band gap of the bulk Si crystal, or the red shift in the PL from amorphous Si. The intensity of the PL peaks showed a decrease with increasing pressure. We have also observed a red shift with time when a blue laser continuously illuminated the sample. These results on the pressure dependence of porous Si provide critical information for modeling and determining the electronic structure of porous silicon. |
doi_str_mv | 10.1063/1.108466 |
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fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1063_1_108466</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>5530688</sourcerecordid><originalsourceid>FETCH-LOGICAL-c320t-e7b019bf4cc02485c8ce3cca977a86a3205a604bc77283a612cf59679c3c88d13</originalsourceid><addsrcrecordid>eNo9j81KxDAURoMoOI6Cj5CFCzfVe3ubny5lUEcYcKPrkl7TMVKbknQE395KxdXhg8MHR4hLhBsETbc4w1ZaH4kVgjEFIdpjsQIAKnSt8FSc5fwxT1USrYTahv27HJPP-ZC8jOMU2PUyDF8-T2HvphAHGTs5xhQPWebQB47DuTjpXJ_9xR_X4vXh_mWzLXbPj0-bu13BVMJUeNMC1m1XMUNZWcWWPTG72hhntZsd5TRULRtTWnIaS-5UrU3NxNa-Ia3F9fLLKeacfNeMKXy69N0gNL-5DTZL7qxeLero8lzQJTdwyP--UgTaWvoB2ChTSg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>High pressure optical investigation of porous silicon</title><source>AIP Digital Archive</source><creator>ZHOU, W ; SHEN, H ; HARVEY, J. F ; LUX, R. A ; DUTTA, M ; LU, F ; PERRY, C. H ; TSU, R ; KALKHORAN, N. M ; NAMAVAR, F</creator><creatorcontrib>ZHOU, W ; SHEN, H ; HARVEY, J. F ; LUX, R. A ; DUTTA, M ; LU, F ; PERRY, C. H ; TSU, R ; KALKHORAN, N. M ; NAMAVAR, F</creatorcontrib><description>We have performed the first photoluminescence (PL) measurements under hydrostatic pressure up to 37 kbar at room temperature on several porous silicon (Si) samples fabricated under different etching conditions. A blue shift of the PL peak energy was observed in all samples from 0 to ∼20 kbar. Above ∼20 kbar, the PL peak energy appears to be constant or even to exhibit a small red shift with pressure in some samples. This pressure dependence of the PL peak energy of porous Si is different from the pressure induced red shift in the PL from the indirect band gap of the bulk Si crystal, or the red shift in the PL from amorphous Si. The intensity of the PL peaks showed a decrease with increasing pressure. We have also observed a red shift with time when a blue laser continuously illuminated the sample. These results on the pressure dependence of porous Si provide critical information for modeling and determining the electronic structure of porous silicon.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.108466</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Photoluminescence ; Physics</subject><ispartof>Applied physics letters, 1992-09, Vol.61 (12), p.1435-1437</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c320t-e7b019bf4cc02485c8ce3cca977a86a3205a604bc77283a612cf59679c3c88d13</citedby><cites>FETCH-LOGICAL-c320t-e7b019bf4cc02485c8ce3cca977a86a3205a604bc77283a612cf59679c3c88d13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5530688$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ZHOU, W</creatorcontrib><creatorcontrib>SHEN, H</creatorcontrib><creatorcontrib>HARVEY, J. F</creatorcontrib><creatorcontrib>LUX, R. A</creatorcontrib><creatorcontrib>DUTTA, M</creatorcontrib><creatorcontrib>LU, F</creatorcontrib><creatorcontrib>PERRY, C. H</creatorcontrib><creatorcontrib>TSU, R</creatorcontrib><creatorcontrib>KALKHORAN, N. M</creatorcontrib><creatorcontrib>NAMAVAR, F</creatorcontrib><title>High pressure optical investigation of porous silicon</title><title>Applied physics letters</title><description>We have performed the first photoluminescence (PL) measurements under hydrostatic pressure up to 37 kbar at room temperature on several porous silicon (Si) samples fabricated under different etching conditions. A blue shift of the PL peak energy was observed in all samples from 0 to ∼20 kbar. Above ∼20 kbar, the PL peak energy appears to be constant or even to exhibit a small red shift with pressure in some samples. This pressure dependence of the PL peak energy of porous Si is different from the pressure induced red shift in the PL from the indirect band gap of the bulk Si crystal, or the red shift in the PL from amorphous Si. The intensity of the PL peaks showed a decrease with increasing pressure. We have also observed a red shift with time when a blue laser continuously illuminated the sample. These results on the pressure dependence of porous Si provide critical information for modeling and determining the electronic structure of porous silicon.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Photoluminescence</subject><subject>Physics</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNo9j81KxDAURoMoOI6Cj5CFCzfVe3ubny5lUEcYcKPrkl7TMVKbknQE395KxdXhg8MHR4hLhBsETbc4w1ZaH4kVgjEFIdpjsQIAKnSt8FSc5fwxT1USrYTahv27HJPP-ZC8jOMU2PUyDF8-T2HvphAHGTs5xhQPWebQB47DuTjpXJ_9xR_X4vXh_mWzLXbPj0-bu13BVMJUeNMC1m1XMUNZWcWWPTG72hhntZsd5TRULRtTWnIaS-5UrU3NxNa-Ia3F9fLLKeacfNeMKXy69N0gNL-5DTZL7qxeLero8lzQJTdwyP--UgTaWvoB2ChTSg</recordid><startdate>19920921</startdate><enddate>19920921</enddate><creator>ZHOU, W</creator><creator>SHEN, H</creator><creator>HARVEY, J. F</creator><creator>LUX, R. A</creator><creator>DUTTA, M</creator><creator>LU, F</creator><creator>PERRY, C. H</creator><creator>TSU, R</creator><creator>KALKHORAN, N. M</creator><creator>NAMAVAR, F</creator><general>American Institute of Physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19920921</creationdate><title>High pressure optical investigation of porous silicon</title><author>ZHOU, W ; SHEN, H ; HARVEY, J. F ; LUX, R. A ; DUTTA, M ; LU, F ; PERRY, C. H ; TSU, R ; KALKHORAN, N. M ; NAMAVAR, F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c320t-e7b019bf4cc02485c8ce3cca977a86a3205a604bc77283a612cf59679c3c88d13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Photoluminescence</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ZHOU, W</creatorcontrib><creatorcontrib>SHEN, H</creatorcontrib><creatorcontrib>HARVEY, J. F</creatorcontrib><creatorcontrib>LUX, R. A</creatorcontrib><creatorcontrib>DUTTA, M</creatorcontrib><creatorcontrib>LU, F</creatorcontrib><creatorcontrib>PERRY, C. H</creatorcontrib><creatorcontrib>TSU, R</creatorcontrib><creatorcontrib>KALKHORAN, N. M</creatorcontrib><creatorcontrib>NAMAVAR, F</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ZHOU, W</au><au>SHEN, H</au><au>HARVEY, J. F</au><au>LUX, R. A</au><au>DUTTA, M</au><au>LU, F</au><au>PERRY, C. H</au><au>TSU, R</au><au>KALKHORAN, N. M</au><au>NAMAVAR, F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High pressure optical investigation of porous silicon</atitle><jtitle>Applied physics letters</jtitle><date>1992-09-21</date><risdate>1992</risdate><volume>61</volume><issue>12</issue><spage>1435</spage><epage>1437</epage><pages>1435-1437</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>We have performed the first photoluminescence (PL) measurements under hydrostatic pressure up to 37 kbar at room temperature on several porous silicon (Si) samples fabricated under different etching conditions. A blue shift of the PL peak energy was observed in all samples from 0 to ∼20 kbar. Above ∼20 kbar, the PL peak energy appears to be constant or even to exhibit a small red shift with pressure in some samples. This pressure dependence of the PL peak energy of porous Si is different from the pressure induced red shift in the PL from the indirect band gap of the bulk Si crystal, or the red shift in the PL from amorphous Si. The intensity of the PL peaks showed a decrease with increasing pressure. We have also observed a red shift with time when a blue laser continuously illuminated the sample. These results on the pressure dependence of porous Si provide critical information for modeling and determining the electronic structure of porous silicon.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.108466</doi><tpages>3</tpages></addata></record> |
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subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Photoluminescence Physics |
title | High pressure optical investigation of porous silicon |
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