Surface-enhanced Raman spectroscopy of chemical vapor deposited diamond films
By using surface-enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured th...
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| Veröffentlicht in: | Applied physics letters 1990-04, Vol.56 (14), p.1320-1322 |
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| container_title | Applied physics letters |
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| creator | KNIGHT, D. S WEIMER, R PILIONE, L WHITE, W. B |
| description | By using surface-enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured through the silver layer exhibited the 1332 cm−1 diamond line and broadbands due to other forms of carbon. Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon. |
| doi_str_mv | 10.1063/1.102505 |
| format | Article |
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Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon.</description><identifier>ISSN: 0003-6951</identifier><identifier>EISSN: 1077-3118</identifier><identifier>DOI: 10.1063/1.102505</identifier><identifier>CODEN: APPLAB</identifier><language>eng</language><publisher>Melville, NY: American Institute of Physics</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Physics ; Solid surfaces and solid-solid interfaces ; Surface and interface dynamics and vibrations ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Applied physics letters, 1990-04, Vol.56 (14), p.1320-1322</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c320t-75193829d8a76cacc7b00b3940d3d1180a2ffdcbe4bcf2d9f2ba8034d7d97c683</citedby><cites>FETCH-LOGICAL-c320t-75193829d8a76cacc7b00b3940d3d1180a2ffdcbe4bcf2d9f2ba8034d7d97c683</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5585535$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KNIGHT, D. S</creatorcontrib><creatorcontrib>WEIMER, R</creatorcontrib><creatorcontrib>PILIONE, L</creatorcontrib><creatorcontrib>WHITE, W. B</creatorcontrib><title>Surface-enhanced Raman spectroscopy of chemical vapor deposited diamond films</title><title>Applied physics letters</title><description>By using surface-enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured through the silver layer exhibited the 1332 cm−1 diamond line and broadbands due to other forms of carbon. Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface and interface dynamics and vibrations</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1990</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEQhoMoWKvgT8jBg5fVSabZ7B6laBUqgh_nZXaS0JXuB0kV-u-NVDy9DDy8PPMKcangRkGJtyqHNmCOxEyBtQUqVR2LGQBgUdZGnYqzlD7zaTTiTDy_fcVA7As_bGhg7-Qr9TTINHnexTHxOO3lGCRvfN8xbeU3TWOUzk9j6nYZdx314-Bk6LZ9OhcngbbJX_zlXHw83L8vH4v1y-ppebcuGDXsCmtUjZWuXUW2ZGK2LUCL9QIcuuwLpENw3PpFy0G7OuiWKsCFs662XFY4F9eHXs6KKfrQTLHrKe4bBc3vDI1qDjNk9OqATpSyf4j5yy7988ZUxqDBH47KXKI</recordid><startdate>19900402</startdate><enddate>19900402</enddate><creator>KNIGHT, D. 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B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c320t-75193829d8a76cacc7b00b3940d3d1180a2ffdcbe4bcf2d9f2ba8034d7d97c683</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1990</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface and interface dynamics and vibrations</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KNIGHT, D. S</creatorcontrib><creatorcontrib>WEIMER, R</creatorcontrib><creatorcontrib>PILIONE, L</creatorcontrib><creatorcontrib>WHITE, W. B</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KNIGHT, D. S</au><au>WEIMER, R</au><au>PILIONE, L</au><au>WHITE, W. B</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface-enhanced Raman spectroscopy of chemical vapor deposited diamond films</atitle><jtitle>Applied physics letters</jtitle><date>1990-04-02</date><risdate>1990</risdate><volume>56</volume><issue>14</issue><spage>1320</spage><epage>1322</epage><pages>1320-1322</pages><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>By using surface-enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured through the silver layer exhibited the 1332 cm−1 diamond line and broadbands due to other forms of carbon. Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon.</abstract><cop>Melville, NY</cop><pub>American Institute of Physics</pub><doi>10.1063/1.102505</doi><tpages>3</tpages></addata></record> |
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| ispartof | Applied physics letters, 1990-04, Vol.56 (14), p.1320-1322 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_102505 |
| source | AIP Digital Archive |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface and interface dynamics and vibrations Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
| title | Surface-enhanced Raman spectroscopy of chemical vapor deposited diamond films |
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