Influence of the atmospheric humidity on the behaviour of silicon AFM probes in photon scanning tunneling microscopy

The photon scanning tunneling microscopy (PSTM) allows to characterize the surface topography with high resolution. This microscopy exploits the exponential decay of the evanescent field achieved by the total internal reflection under the surface sample. When the distance between the sensor and the...

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Veröffentlicht in:	European physical journal. Applied physics 1998-11, Vol.4 (2), p.213-217
Hauptverfasser:	Benfedda, M., Lahimer, S., Bonnafe, J.
Format:	Artikel
Sprache:	eng
Schlagworte:	07.79.Fc Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques Scanning tunneling microscopes
Online-Zugang:	Volltext
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