Saturation effects in TXRF on micro-droplet residue samples
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| Veröffentlicht in: | Journal of analytical atomic spectrometry 2004-01, Vol.19 (12), p.1517 |
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| Sprache: | eng |
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| container_issue | 12 |
| container_start_page | 1517 |
| container_title | Journal of analytical atomic spectrometry |
| container_volume | 19 |
| creator | Hellin, David Fyen, Wim Rip, Jens Delande, Tinne Mertens, Paul W. De Gendt, Stefan Vinckier, Chris |
| description | |
| doi_str_mv | 10.1039/b410643a |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0267-9477 |
| ispartof | Journal of analytical atomic spectrometry, 2004-01, Vol.19 (12), p.1517 |
| issn | 0267-9477 1364-5544 |
| language | eng |
| recordid | cdi_crossref_primary_10_1039_b410643a |
| source | Royal Society of Chemistry Journals Archive (1841-2007); Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection |
| title | Saturation effects in TXRF on micro-droplet residue samples |
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