Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

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Veröffentlicht in:Journal of analytical atomic spectrometry 2003-03, Vol.18 (4), p.350-357
Hauptverfasser: Kempenaers, L., Janssens, K., Jochum, K. P., Vincze, L., Vekemans, B., Somogyi, A., Drakopoulos, M., Adams, F.
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container_end_page 357
container_issue 4
container_start_page 350
container_title Journal of analytical atomic spectrometry
container_volume 18
creator Kempenaers, L.
Janssens, K.
Jochum, K. P.
Vincze, L.
Vekemans, B.
Somogyi, A.
Drakopoulos, M.
Adams, F.
description
doi_str_mv 10.1039/b212196d
format Article
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source Royal Society of Chemistry Journals Archive (1841-2007); Royal Society Of Chemistry Journals 2008-; Alma/SFX Local Collection
title Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF
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