Investigation of the crack extending downward along the seed of the β-Ga 2 O 3 crystal grown by the EFG method

A crack extending downward along the seed of a beta-gallium oxide (β-Ga 2 O 3 ) crystal grown using the edge-defined film-fed growth (EFG) method severely affects the efficiency of crystal slicing. In this study, the influence of the crack on the structural, electronic, and optical properties, as we...

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Veröffentlicht in:	CrystEngComm 2021-09, Vol.23 (36), p.6300-6306
Hauptverfasser:	Li, Pengkun, Bu, Yuzhe, Chen, Duanyang, Sai, Qinglin, Qi, Hongji
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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