Multi-level control of conductive nano-filament evolution in HfO 2 ReRAM by pulse-train operations

Precise electrical manipulation of nanoscale defects such as vacancy nano-filaments is highly desired for the multi-level control of ReRAM. In this paper we present a systematic investigation on the pulse-train operation scheme for reliable multi-level control of conductive filament evolution. By ap...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Nanoscale 2014-06, Vol.6 (11), p.5698-5702
Hauptverfasser:	Zhao, L., Chen, H.-Y., Wu, S.-C., Jiang, Z., Yu, S., Hou, T.-H., Wong, H.-S. Philip, Nishi, Y.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!