In situ electron holography study of charge distribution in high-κ charge-trapping memory

Charge-trapping memory with high- κ insulator films is a candidate for future memory devices. Many efforts with different indirect methods have been made to confirm the trapping position of the charges, but the reported results in the literatures are contrary, from the bottom to the top of the trapp...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Nature communications 2013-11, Vol.4 (1), p.2764, Article 2764
Hauptverfasser: Yao, Y., Li, C., Huo, Z. L., Liu, M., Zhu, C. X., Gu, C. Z., Duan, X. F., Wang, Y. G., Gu, L., Yu, R. C.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!