Electron impact dissociative excitation of O 2 : 2. Absolute emission cross sections of the OI(130.4 nm) and OI(135.6 nm) lines
In this work, we report the OI(135.6 nm) absolute emission cross section resulting from the long‐lived (180 μs) OI( 5 S → 3 P ) transition from dissociative excitation of O 2 . From the ratio of the integrated intensities of the OI(135.6 nm) and OI(130.4 nm) features and from the absolute emission c...
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Veröffentlicht in: | Journal of Geophysical Research: Planets 2003-11, Vol.108 (E11) |
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Hauptverfasser: | , , , , , |
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Sprache: | eng |
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Zusammenfassung: | In this work, we report the OI(135.6 nm) absolute emission cross section resulting from the long‐lived (180 μs) OI(
5
S
→
3
P
) transition from dissociative excitation of O
2
. From the ratio of the integrated intensities of the OI(135.6 nm) and OI(130.4 nm) features and from the absolute emission cross section for the OI(130.4 nm) emission feature from electron impact dissociative excitation of O
2
at 100 eV, the absolute emission cross section for the OI(135.6 nm) feature was determined to be 6.4 × 10
−18
cm
2
at 100 eV. Electron impact‐induced optical excitation functions for optically allowed transitions at 115.2 nm and 130.4 nm and for an optically forbidden transition at 135.6 nm were also obtained over the electron impact energy range 0–600 eV. The OI(135.6 nm) emission cross section was measured in the laboratory utilizing a large collision chamber (1.5 m in diameter). Electrons were produced with an electrostatically focusing gun with a large focal length (50 cm). The OI(130.4 nm, 135.6 nm) excitation functions were put on an absolute scale as described in the text, and the OI(135.6 nm)/OI(130.4 nm) ratio was determined for the entire energy range (0–600 eV). The atomic O UV emission cross sections from dissociative excitation of O
2
can be used to model the recent Hubble Space Telescope observations of OI(130.4 nm) and OI(135.6 nm) intensities from Ganymede [
Feldman et al.
, 2000
] and Europa [
Hall et al.
, 1995
,
1998
]. |
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ISSN: | 0148-0227 |
DOI: | 10.1029/2000JE001423 |