X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface

X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface

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Veröffentlicht in:Langmuir 2003-12, Vol.19 (26), p.10997-10999
Hauptverfasser: Kubowicz, Stephan, Thünemann, Andreas F, Geue, Thomas M, Pietsch, Ullrich, Watson, Mark D, Tchebotareva, Natalia, Müllen, Klaus
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container_end_page 10999
container_issue 26
container_start_page 10997
container_title Langmuir
container_volume 19
creator Kubowicz, Stephan
Thünemann, Andreas F
Geue, Thomas M
Pietsch, Ullrich
Watson, Mark D
Tchebotareva, Natalia
Müllen, Klaus
description
doi_str_mv 10.1021/la035210e
format Article
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title X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface
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