$Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry$

Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry

For the first time, the thickness and refractive index of monolayers at the air/water interface have simultaneously been determined by null ellipsometry. Separation of refractive index from film thickness has been achieved by highly precise measurements of the two ellipsometric angles Ψ and Δ. In th...

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Veröffentlicht in:	Langmuir 2001-11, Vol.17 (24), p.7529-7534
Hauptverfasser:	Ducharme, Daniel, Tessier, Alain, Russev, Stoyan C
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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