Weibull Analysis of Dielectric Breakdown in a Self-Assembled Nanodielectric for Organic Transistors

The effect of thermal annealing on leakage current and dielectric breakdown in self-assembled nanodielectric (SAND) metal−insulator−semiconductor (MIS) devices is investigated. Annealing at temperatures of ≥300 °C for 120 s in a reducing atmosphere significantly reduces the leakage current density a...

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Veröffentlicht in:	The journal of physical chemistry letters 2010-11, Vol.1 (22), p.3292-3297
Hauptverfasser:	Schlitz, Ruth A, Yoon, KunHo, Fredin, Lisa A, Ha, Young-geun, Ratner, Mark A, Marks, Tobin J, Lauhon, Lincoln J
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron Transport, Optical and Electronic Devices, Hard Matter
Online-Zugang:	Volltext
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