Extended X-ray Absorption Fine Structure and X-ray Diffraction Examination of Sputtered Nickel Carbon Binary Thin Films for Fuel Cell Applications

Extended X-ray absorption fine structure (EXAFS) and X-ray diffraction (XRD) are used to study the structure of sputtered binary nickel carbon alloy films (5–44 atom % Ni) for use as potential electrocatalysts in acidic solutions. Three compositional regions are identified: “low” (5 atom % Ni), wher...

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Veröffentlicht in:	Journal of physical chemistry. C 2012-03, Vol.116 (10), p.6159-6165
Hauptverfasser:	Ingham, Bridget, Gaston, Nicola, Fahy, Kieran, Chin, Xiao Yao, Dotzler, Christian J, Rees, Eric, Haslam, Gareth, Barber, Zoe H, Burstein, G. Timothy, Ryan, Mary P
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Cross-disciplinary physics: materials science rheology Deposition by sputtering Direct energy conversion and energy accumulation Electrical engineering. Electrical power engineering Electrical power engineering Electrochemical conversion: primary and secondary batteries, fuel cells Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics
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