Critical Point and Vapor Pressure Measurements at High Temperatures by Means of a New Apparatus with Ultralow Residence Times

A new flow method has been employed to obtain critical point and vapor pressure data at high temperatures for four compounds:  squalane, toluene, ethylbenzene, and styrene. This new flow method allows the determination of reliable critical points and vapor pressures for thermally unstable or otherwi...

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Veröffentlicht in:Journal of chemical and engineering data 2000-03, Vol.45 (2), p.157-160
Hauptverfasser: VonNiederhausern, David M, Wilson, Grant M, Giles, Neil F
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Sprache:eng
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