Critical Point and Vapor Pressure Measurements at High Temperatures by Means of a New Apparatus with Ultralow Residence Times
A new flow method has been employed to obtain critical point and vapor pressure data at high temperatures for four compounds: squalane, toluene, ethylbenzene, and styrene. This new flow method allows the determination of reliable critical points and vapor pressures for thermally unstable or otherwi...
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Veröffentlicht in: | Journal of chemical and engineering data 2000-03, Vol.45 (2), p.157-160 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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