Characterization of Heavy Residuum by a Small Angle X-ray Scattering Technique
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| Veröffentlicht in: | Industrial & engineering chemistry fundamentals 1979-02, Vol.18 (1), p.60-63 |
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| Format: | Artikel |
| Sprache: | eng |
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| container_end_page | 63 |
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| container_issue | 1 |
| container_start_page | 60 |
| container_title | Industrial & engineering chemistry fundamentals |
| container_volume | 18 |
| creator | Kim, Hyo-gun Long, Robert B |
| description | |
| doi_str_mv | 10.1021/i160069a014 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0196-4313 |
| ispartof | Industrial & engineering chemistry fundamentals, 1979-02, Vol.18 (1), p.60-63 |
| issn | 0196-4313 1541-4833 |
| language | eng |
| recordid | cdi_crossref_primary_10_1021_i160069a014 |
| source | American Chemical Society Journals |
| title | Characterization of Heavy Residuum by a Small Angle X-ray Scattering Technique |
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