Curious Morphology of Silicon-Containing Polymer Films on Exposure to Oxygen Plasma

Thin films of silicon-containing polymers were studied to investigate changes in surface composition and morphology on exposure to an oxygen plasma. For low molecular weight poly(pentamethyldisilylstyrene) (P(PMDSS)), a reticulated structure was observed by atomic force microscopy (AFM) that could l...

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Veröffentlicht in:Chemistry of Materials 1998-12, Vol.10 (12), p.3895-3901
Hauptverfasser: Chan, Vanessa Z.-H, Thomas, Edwin L, Frommer, Jane, Sampson, David, Campbell, Richard, Miller, Dolores, Hawker, Craig, Lee, Victor, Miller, Robert D
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Sprache:eng
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