Curious Morphology of Silicon-Containing Polymer Films on Exposure to Oxygen Plasma
Thin films of silicon-containing polymers were studied to investigate changes in surface composition and morphology on exposure to an oxygen plasma. For low molecular weight poly(pentamethyldisilylstyrene) (P(PMDSS)), a reticulated structure was observed by atomic force microscopy (AFM) that could l...
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Veröffentlicht in: | Chemistry of Materials 1998-12, Vol.10 (12), p.3895-3901 |
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Sprache: | eng |
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