An In-Situ Synchrotron X-ray Diffraction Tomography Study of Crystallization and Preferred Crystal Orientation in a Stirred Reactor
A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to crystallite shape/size characteristics; in particular, stirring induces pronounc...
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Veröffentlicht in: | Crystal growth & design 2005-03, Vol.5 (2), p.395-397 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to crystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation. |
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ISSN: | 1528-7483 1528-7505 |
DOI: | 10.1021/cg0497288 |