All-Optical Self-Referenced Transverse Position Sensing with Subnanometer Precision

The emergence of technologies operating at the nanometer scale for applications as varied as nanofabrication and super-resolution microscopy has driven the need for ever more accurate spatial localization. In this context, nanostructures have been used as probes in order to provide a reference to tr...

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Veröffentlicht in:	ACS photonics 2018-09, Vol.5 (9), p.3628-3633
Hauptverfasser:	Tischler, Nora, Stark, Johannes, Zambrana-Puyalto, Xavier, Fernandez-Corbaton, Ivan, Vidal, Xavier, Molina-Terriza, Gabriel, Juan, Mathieu L
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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