Antireflection Substrates for Determining the Number of Layers of Few-Layer Hexagonal Boron Nitride Films and for Visualizing Organic Monolayers

Visualization of layered materials with atomic-scale thickness by optical interference with a low-reflection substrate has been widely used to identify exfoliated thin flakes. However, the identification of optically transparent films with an atomic-scale thickness, such as hexagonal boron nitride (...

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Veröffentlicht in:	ACS applied nano materials 2023-12, Vol.6 (23), p.21876-21886
Hauptverfasser:	Hattori, Yoshiaki, Taniguchi, Takashi, Watanabe, Kenji, Kitamura, Masatoshi
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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